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OmniTek BV brings you current developments in elemental spectrometry:
Xenemetrix Genius IF compact built secondary target ED-XRF
[Newsletter 12 - November 2013]
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Meridiaan 40
2801 DA Gouda
The Netherlands
Tel:+31-(0)182-302990
Fax:+31-(0)182-302999
E-mail: news@omnitek.nl
Internet: www.omnitek.nl
Introduction of Xenemetrix

With more than 30 years experience, Xenemetrix Ltd. specializes in the design, development, production and marketing of Energy-Dispersive X-Ray Fluorescence (EDXRF) systems.

Xenemetrix continues to develop highly innovative technologies and solutions suitable for today’s ever-growing analytical challenges, performing non-destructive elemental analysis starting from Carbon (6) through Fermium (100), while providing detection limits from low parts-per-billion (ppb) to high weight percent (%wt).


An offer you can't resist

Xenemetrix offers Genius IF for a price of 15% less of list price. So for a price of a bench-top unit you'll get a true secondary target instrument.

But that's not all. As exchange rate for $ / € is extremely beneficial to European customers, installation price will be surprisingly low these days.


Xenemetrix GENIUS IF - Compact built Secondary Target ED-XRF

SDD / LE Bench Top EDXRF Spectrometer with Secondary Target Excitation Mode



  • Non-destructive elemental analysis, C(6) - Fm(100), starting from sub-ppm to 100% concentrations
  • Unique patented geometry combines eight secondary targets and eight customizable tube filters for fast and accurate determination of trace and minor elements
  • Silicon Drift Detector (SDD) enables extremely high count rate applications with excellent energy resolution, down to 123eV, suitable for both high and low Z elements & light elements optimized detector
  • Sample tray with 8/16 positions
  • Strong analytical software package
Xenemetrix’s Genius IF (Secondary Targets) ED-XRF spectrometer offers a cost-effective solution in today’s market of elemental analysis. The analyzer provides a non-destructive qualitative and quantitative determination from Carbon (6) to Fermium (100), providing detection limits from sub-ppm to high weight percent concentrations.
 

The Genius IF has powerful components including:
  • A fully integrated computer system
  • A high resolution Silicon Drift Detector
  • A powerful X-Ray tube with variable spot sizes, designed to accommodate samples of various sizes
  • Eight secondary targets and eight customizable tube filters for fast and accurate determination of trace and minor elements
Silicon Drift Detector (SDD):
  • The Silicon Drift Detector enables high count rates, improved resolution, down to 123eV and fast response time, in order to minimize operational down time.
SDD LE:
  • Ultra-thin detector window provides superior performance for low Z elements analysis.

Find the differences - traditional size vs modern size






Applications :
  •  Petrochemicals
  •  Polymers
  •  Metallurgical samples
  •  Alloys
  •  Environmental
  •  Oil, Fuels, Diesel & Liquids
  •  Mining & Geological
  •   (Including rare earth elements)
  •  Forensics
  •  Authentication & Precious Metals
  •  Pharmaceutical & Biomedical


Your application not listed here?

  Please contact us for discussing your products and applications.  
Former newsletters:


- #11: October 2013 - Developments in spectrometry: ED-XRF, RDE OES and Electron Spin Resonance


- #10: August 2013 - Low Resolution IR and Electron Spin Resonance

- #9: July 2013 - OmniTek U-VIsc series : Automated ASTM D445 Kinematic Viscometers
Other instruments from OmniTek
 
Physical properties Brands Systems
Kinematic Viscometers OmniTek Houillon , Ubbelohde
Rotational Viscometers Rheosys Merlin rheometer
Infra-Red Spectrometers Wilks IR
Spectro
ATR IR
Oil Condition spectrometer
Elemental Spectrometers Spectro Fuel: Spectroil M 
Oil: Spectro Q100
Particle Analyzers Spectro
V4L
LNF Q200
Filter Patch Scan
ED-XRF Spectrometers Xenemetrix Portable
Benchtop
Secondary target
Copyright © 2013 OmniTek BV, All rights reserved.


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